Alicona IFM G4
The Alicona G4 Infinite Focus Microscope is a non-contact optical surface metrology instrument operating on the focus variation principle. It offers the benefits of 3D micro coordinate measurement and surface roughness measurement within the same instrument. With both coaxial lightning and optimized LED ring lighting a large rang of surface types with high surface slopes can be measured. Traceable measurements are possible with a combination of high resolution, high repeatability and high accuracy. This flexible system with its multi-functional sensor allows measurements to be carried out across a wide range of applications by a range of users. To further simplifying its operation the user interface offers a significant level of measurement parameters automation. A dedicated scripting language allows more sophisticated automation of both measurement and analysis procedures to allow unattended operation.
Bruker Dektak XT
The Bruker Dektak XT is a low force contact stylus surface profiler instrument.
The Dektak XT is the tenth generation of the brand which has been in development for over forty years. It is now capable of the measuring a nanometre surface step and achieving a claimed repeatability figure of four Angstroms. This model is used extensively for semiconductor, solar and high power LED applications, as well as in many other surface profiling roles.
Bruker Dimension Icon Atomic Force Microscope (AFM)
The Bruker Icon range offers the capability to map nano-mechanical property mapping in parallel with surface topography imaging. Nanomanipulation and lithography can be carried out at the molecular scale, along with precision heating and cooling over -30 to 250oc range. In addition nano scale electrical characterisation can be carried out in combination with scanning capacitance microscopy, scanning spreading resistance, and tunnelling AFM.
The Icon offers class leading closed-loop measurement noise levels with imaging at the sub Angstrom level with claimed noise floor below 30pm (10-12). Automation scripting allows the instrument to combine high resolution AFM imaging with high speed autonomous metrology.
